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Surface Analysis Accessory

  • Electron Sources
  • Electron Sources
  • Electron Sources
  • Electron Sources
Electron SourcesElectron SourcesElectron SourcesElectron Sources

Electron Sources

  • Product description: These universal use electron sources provide a wide range of beam currents and spot sizes, including but not limited to those shown below. Typical applications include AUGER (AES), Energy Loss Spectro
  • INQUIRY

These universal use electron sources provide a wide range of beam currents and spot sizes, including but not limited to those shown below. Typical applications include AUGER (AES), Energy Loss Spectroscopy (ELS), X-ray analyses (XPS) and cathodoluminescence studies.



General Purpose Electron Sources

Max. Energy Max. Beam Current Model Description
3 keV 20 µA » ES-380
3 keV 300 µA » ES-380-HC
5 keV 20 µA » ES-550
5 keV 300 µA » ES-550-HC
10 keV 40 µA » ES-1050
10 keV 200 µA » ES-1050-HC



Microfocus and Nanofocus Electron Sources

Min. Spot Size Max. Energy Model Description
<85 nm 15 keV » EF-15005
150 nm 12 keV » EF-1201
250 nm 12 keV » EF-1202
400 nm 10 keV » EF-1005
2 µm 8 keV » EM-802
3 µm 5 keV » EM-503
6 µm 5 keV » EM-506

Electron Flood Sources

Max. Energy Model Description
100 eV » F01CC
5 keV » EMF-5
10 keV » EMF-10
20 keV » EHF-20
30 keV » EHF-30
40 keV » EHF-40
50 keV » EHF-50
60 keV » EHF-60
80 keV » EHF-80
100 keV » EHF-100

High Beam Power Electron Sources

Max. Energy Max. Beam Current Power Model Description
3 keV 300 µA » ES-380-HC
5 keV 300 µA » ES-550-HC
10 keV 200 µA » ES-1050-HC
20 keV 0.5 mA / 1.0 mA 10 W / 20 W » EH-20-10 / EH-20-20
30 keV 1.0 mA / 3.3 mA 30 W / 100 W » EH-30-30 / EH-30-100
40 keV 0.5 mA / 1.0 mA 20 W / 40 W » EH-40-20 / EH-40-40
50 keV 0.5 mA / 1.0 mA 25 W / 50 W » EH-50-25 / EH-50-50
60 keV 0.5 mA / 1.0 mA 30 W / 60 W » EH-60-30 / EH-60-60
80 keV 0.5 mA / 1.0 mA 40 W / 80 W » EH-80-40 / EH-80-80
100 keV 0.5 mA / 1.0 mA 50 W / 100 W » EH-100-50 / EH-100-100

High Energy Small Focus Electron Sources

Max. Energy Spot Size
Model Description
20 keV <150 µm » EH-20
30 keV <150 µm » EH-30
40 keV <150 µm » EH-40
50 keV <150 µm » EH-50
60 keV <150 µm » EH-60
80 keV <150 µm » EH-80
100 keV <150 µm » EH-100
60 keV 50 µm » GDS 60 (for GED applications)

Low Energy Electron Sources

Max. Energy Max. Beam Current Special features
Model Description
100 eV 100 µA » NEK-150
100 eV 100 µA scannable » NEK-150-SC
100 eV 20 µA for charge compensation » F01CC

Electron Sources for RHEED

Max. Energy Model Description
12 keV » RHEED-12
15 keV » RHEED-15
20 keV » RHEED-20
30 keV » RHEED-30
35 keV » RHEED-35
40 keV » RHEED-40
50 keV » RHEED-50
60 keV » RHEED-60

CONTACT US

Contact: Nana Zhang

Phone: 18201230727

Tel: 010-80698356

Email: Info@be-instruments.com

Add: Room 1310, AirChina Plaza, No. 36 Xiaoyun Road, Chaoyang District, Beijing